VeEX TX300s-100G optical and service test platform

The VeEX TX300s-100G optical and service test platform, with the latest technology in pluggable physical interfaces, is suitable for the TX300s platform, extending its testing range to 100 Gbps. Compatibility with the companion TX320sm option offers a complete 64k to 100G test solution in a compact portable package.

Installation, commissioning, monitoring and maintenance of Ethernet, OTN and SDH/SONET networks are simplified due to a combination of intuitive features and test functions. Fast troubleshooting and comprehensive analysis of transmission problems can be performed using its common graphical user interface. Novice users benefit from the easy-to-use GUI, while experienced users will appreciate an array of advanced features such as OTL/PCS, CAUI-4/XLAUI Lane BERT, Service Disruption, overhead monitor/control, tandem connection monitoring, protocol capture/decode, BERT and throughput test.

Module features include CFP4 interface for 100GE and OTU4 applications; QSFP+ for 40GE, OTU3, STM-256/OC-768 and STL256.4; external clock interface; 150 ppm clock offset generation; and soft LED indicators.

Ethernet features include 40 Gbps and 100 Gbps Ethernet testing; optical Lane BERT and CAUI-4/XLAUI Lane BERT; PCS layer testing with Skew generation/monitoring; multistream testing up to 32 independent streams; IEEE 802.3ah, ITU-T Y.1731, IEEE 802.1ag, MPLS-TP OAM support; Q in Q (VLAN stacking), MPLS, MPLS-TP, PBB, EoE support; MAC flooding; RFC2544 and V-SAM (Y.1564) testing; service disruption measurements; IPv4 and IPv6 traffic generation; BERT and throughput testing at Layer 2 and Layer 3; smart loopback mode for Layer 2 and Layer 3; one-way-delay latency measurement (GPS assisted); line rate packet capture with Wireshark decode; and error and alarm injection.

OTN testing features include OTN testing for OTU3 and OTU4; complete multistage mapping/multiplexing; Ethernet over OTN; advanced multistep map/mux with SDH/SONET/PDH/DSn test payloads; service disruption measurements; tandem connection monitoring; overhead monitoring and byte decoding; terminate, payload through and line through test modes; per-lane optical power and frequency measurements; external clock reference interface; and histogram analysis.

SDH/SONET testing features include mapped into OTUk payload; STL256.4 with SDH/SONET; STM-256 and OC-768; advanced multistep map/mux with PDH/DSn test payloads; service disruption time (SDT) and automatic protection switching (APS) time measurement for all mapping and multiplexing levels; and test payload multiplexing down to VC11/VT1.5 and internally generated PDH tributaries.

CFP4/QSFP+ support features include optical lane BERT; PCS layer testing with skew generation/monitoring; transmit and receive optical power measurement; and module status display.